Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Interlaboratory Determination of the Calibration Factor for the Measurement of the Interstitial Oxygen Content of Silicon by Infrared Absorption

Published

Author(s)

D. Baghdadi, W M. Bullis, C M. Croarkin, L. Yue-Zhen, Robert I. Scace, R. W. Series, P Stallhofer, M. Tan
Citation
Journal of the Electrochemical Society
Volume
136
Issue
7

Citation

Baghdadi, D. , Bullis, W. , Croarkin, C. , Yue-Zhen, L. , Scace, R. , Series, R. , Stallhofer, P. and Tan, M. (1989), Interlaboratory Determination of the Calibration Factor for the Measurement of the Interstitial Oxygen Content of Silicon by Infrared Absorption, Journal of the Electrochemical Society (Accessed July 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 30, 1989, Updated October 12, 2021