Tang, Y.
, Kupferman, S.
and Salazar, M.
(2002),
Interlaboratory Comparison Using a Transport Josephson Voltage Standard System, Conference on Precision Electromagnetic Measurements Digest, Ottawa, 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30103
(Accessed October 16, 2025)
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Interlaboratory Comparison Using a Transport Josephson Voltage Standard System
Published
Author(s)
, Stuward L. Kupferman, Melquiades T. Salazar
Abstract
A portable Josephson voltage standard (JVS) system has been used as a transfer standard to make an interlaboratory JVS comparison. The results are compared with an interlaboratory comparison between the same two JVS systems using transport Zeners made at about the same time. The portable JVS improves the uncertainty of the comparison between the two JVS systems by a factor of 13 compared to the uncertainty using a conventional Zener MAP procedure. This is largely due to the elimination of the problems associated with non-ideal Zener transportability, environmental dependance, and non-linear drift.Proceedings Title
Conference on Precision Electromagnetic Measurements Digest
Conference Dates
June 16-21, 2002
Conference Location
Ottawa, 1, CA
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
Download Paper
Keywords
Josephson voltage standard, Measurement Assurance Program, uncertainty, Zener Standards
Citation
Issues
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Created May 31, 2002, Updated October 12, 2021