Griesmann, U.
and Kling, R.
(2000),
Interferometric Measurement of Resonance Transition Wavelengths in CIV, SiIV, AlIII, Al II, and SiII, Astrophysical Journal
(Accessed May 11, 2025)
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Interferometric Measurement of Resonance Transition Wavelengths in CIV, SiIV, AlIII, Al II, and SiII
Published
Author(s)
,
Abstract
The wavelength of the important ultraviolet diagnostic lines in the spectra C IV near 155 nm and Si IV near 139 nm were measured with a vacuum ultraviolet Fourier transform spectrometer and a high-current Penning discharge source. Our measurement also provides accurate wavelengths for resonance transitions in Al III, Al III, and Si II.Citation
Astrophysical Journal
Volume
536
Issue
No. 2
Pub Type
Journals
Keywords
C IV, expermental wavelengths, Fourier transform spectrometry, Si IV
Citation
Issues
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Created May 31, 2000, Updated October 12, 2021