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Interferometric Measurement of Resonance Transition Wavelengths in CIV, SiIV, AlIII, Al II, and SiII

Published

Author(s)

Ulf Griesmann, R Kling

Abstract

The wavelength of the important ultraviolet diagnostic lines in the spectra C IV near 155 nm and Si IV near 139 nm were measured with a vacuum ultraviolet Fourier transform spectrometer and a high-current Penning discharge source. Our measurement also provides accurate wavelengths for resonance transitions in Al III, Al III, and Si II.
Citation
Astrophysical Journal
Volume
536
Issue
No. 2

Keywords

C IV, expermental wavelengths, Fourier transform spectrometry, Si IV

Citation

Griesmann, U. and Kling, R. (2000), Interferometric Measurement of Resonance Transition Wavelengths in CIV, SiIV, AlIII, Al II, and SiII, Astrophysical Journal (Accessed April 23, 2024)
Created May 31, 2000, Updated October 12, 2021