Interfacial Roughness Effects on Interlayer Coupling in Spin Values Grown on Different Seed Layers

Published

March 1, 2000

Author(s)

D Parks, P J. Chen, William F. Egelhoff Jr., Romel Gomez

Abstract

We have studied the behavior of interlayer coupling in giant magnetoresistance (GMR) spin valves as a function of seed valves as a function of seed layer composition and spacer layer thickness. Using scanning tunneling microscopy in vacuum, we have measured directly the roughness of the top surface of the lower ferromagnetic layer. We find that the seed layer composition is correlated to the roughnesses of the interfaces inside the spin valve. Interlayer coupling increases with decreasing Cu spacer layer thickness and with increasing interfacial roughness. Results favorably compare to a topographically derived magnetostatic interaction as described by a modified version of Neel's **orange peel** model.

Citation

Journal of Applied Physics

Volume

87

Issue

No. 6

Pub Type

Journals

Keywords

giant magnetoresistance (GMR), scanning tunneling microscopy, spin valves

Citation

Parks, D. , Chen, P. , Egelhoff, W. and Gomez, R. (2000), Interfacial Roughness Effects on Interlayer Coupling in Spin Values Grown on Different Seed Layers, Journal of Applied Physics (Accessed October 13, 2025)