Archenti, A.
, Gao, W.
, Donmez, A.
, Savio, E.
and Irino, N.
(2024),
Integrated metrology for advanced manufacturing, CIRP Annals-Manufacturing Technology, [online], https://doi.org/10.1016/j.cirp.2024.05.003, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957746
(Accessed October 14, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Integrated metrology for advanced manufacturing
Published
Author(s)
andreas archenti, Wei Gao, , Enrico Savio, Naruhiro Irino
Abstract
The transition from conventional standalone metrology to integrated metrology has been accelerating in advanced manufacturing over the past decade. This keynote paper defines the concept of integrated metrology, which extends beyond parts inspection and encompasses processes and manufacturing equipment to enhance efficiency and productivity. The paper presents the characteristics, benefits, constraints, and future possibilities of integrated metrology for parts, processes, and equipment. It also includes a classification of the physical quantities of measurands, the corresponding measuring instruments, data and communication methods, uncertainty, and traceability. The paper also discusses future challenges and emerging trends.Citation
CIRP Annals-Manufacturing Technology
Volume
73
Issue
2
Pub Type
Journals
Download Paper
Keywords
Metrology, Integration, Advanced manufacturing
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created June 1, 2024, Updated March 3, 2025