Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Improved VO2 Microbolometers for Infrared Imaging: Operation on the Semiconducting-Metallic Phase Transition with Negative Electrothermal Feedback

Published

Author(s)

Carl D. Reintsema, Erich N. Grossman, Jonathan A. Koch

Abstract

We have investigated the performance of VO2 microbolometers biased on the semiconducting-metal phase transition with negative electrothermal feedback. We deposited crystalline thin films of phase-pure VO2, patterned these films into useful test structures, and evaluated the electrical and optical properties relevant to improved uncooled bolometric sensors. A novel ac biasing method allows for biasing of the devices on the hysteretic semiconducting-metallic phase transition near 60 0C. Two important advantages result from biasing in the phase transition: high sensitivity, and negative electrothermal feedback (ETF). Under these conditions improvements in speed and noise equivalent power (NEP) are expected. Modest improvements in noise performance and responsivity consistent with simulations were experimentally verified. Our results suggest a large potential performance adavntage over current uncolled vanadium oxide sensors which can be realized as either increased bandwidth (faster frame rates) or higher sensitivity.
Proceedings Title
Proc. Intl. Soc. for Optical Engineering (SPIE)
Volume
3698
Conference Dates
April 5-9, 1999
Conference Location
Orlando, FL
Conference Title
SPIE - The International Society for Optical Engineering

Keywords

electrothermal feedback, microbolometers, semiconductor-metal phase transition, thermal imaging, uncooled, vanadium oxide

Citation

Reintsema, C. , Grossman, E. and Koch, J. (1999), Improved VO<sub>2</sub> Microbolometers for Infrared Imaging: Operation on the Semiconducting-Metallic Phase Transition with Negative Electrothermal Feedback, Proc. Intl. Soc. for Optical Engineering (SPIE), Orlando, FL, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30050 (Accessed October 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 1998, Updated October 12, 2021