Sher, A.
(1975),
Improved infrared response technique for detecting defects and impurities in germanium and silicon d-i-n diodes:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-13
(Accessed January 21, 2025)
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Improved infrared response technique for detecting defects and impurities in germanium and silicon d-i-n diodes:
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- NBS SP 400-13
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NBS SP 400-13
Pub Type
NIST Pubs
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Created January 1, 1975, Updated May 19, 2023