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Improved 1 kHz Capacitance Calibration Uncertainty

Published

Author(s)

Anne-Marie Jeffery, Andrew D. Koffman

Abstract

Uncertainties for 1 kHz capacitance calibrations have been decreased at the National Institute of Standards and Technology (NIST). The improvements are based on frequency-dependence characterization from 1592 Hz to 1 kHz. The relevant measurements and the traceability procedures from the calculable capacitor to the customer calibration are described.
Conference Dates
May 21-23, 2002
Conference Location
Anchorage, AK, USA
Conference Title
Instrumentation and Measurement Technology Conference

Keywords

calibration, capacitance, farad, fused-silica capacitor, impedance, measurement

Citation

Jeffery, A. and Koffman, A. (2002), Improved 1 kHz Capacitance Calibration Uncertainty, Instrumentation and Measurement Technology Conference, Anchorage, AK, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33109 (Accessed April 12, 2024)
Created May 29, 2002, Updated October 12, 2021