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Immersion Fluid Refractive Indices Using Prism Minimum Deviation Techniques, ed. by A. Yen

Published

Author(s)

Roger H. French, Min K. Yang, M F. Lemon, R A. Synowicki, G K. Pribil, G Cooney, C M. Herzinger, S E. Green, John H. Burnett, Simon G. Kaplan
Proceedings Title
Optical Microlithography
Conference Dates
May 1, 2004
Conference Location
Bellingham, WA, USA
Conference Title
Proc. of SPIE XVII

Citation

French, R. , Yang, M. , Lemon, M. , Synowicki, R. , Pribil, G. , Cooney, G. , Herzinger, C. , Green, S. , Burnett, J. and Kaplan, S. (2004), Immersion Fluid Refractive Indices Using Prism Minimum Deviation Techniques, ed. by A. Yen, Optical Microlithography, Bellingham, WA, USA (Accessed December 8, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2003, Updated October 12, 2021