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Imaging of Passivated III-V Semiconductor Surfaces by a Scanning Tunneling Microscope Operating in Air

Published

Author(s)

John A. Dagata, W. F. Tseng, J. Bennett, J. Schneir, Howard H. Harary
Citation
Ultramicroscopy
Volume
42-44

Citation

Dagata, J. , Tseng, W. , Bennett, J. , Schneir, J. and Harary, H. (1992), Imaging of Passivated III-V Semiconductor Surfaces by a Scanning Tunneling Microscope Operating in Air, Ultramicroscopy (Accessed April 26, 2024)
Created December 30, 1992, Updated October 12, 2021