Levine, Z.
, Grantham, S.
, Paterson, D.
, McNulty, I.
, Noyan, I.
and Levin, T.
(2004),
Imaging material components of an integrated circuit interconnect, Journal of Applied Physics
(Accessed October 13, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Imaging material components of an integrated circuit interconnect
Published
Author(s)
, , D Paterson, I McNulty, I C. Noyan, T M. Levin
Citation
Journal of Applied Physics
Volume
95
Issue
1
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2004, Updated February 17, 2017