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How Good Are Your Estimates of t50 and Δ

Published

Author(s)

Harry A. Schafft, J. A. Lechner, B. Sabi, R P. Smith
Proceedings Title
Proc., 1987 Wafer Reliability Workshop
Conference Dates
October 25-28, 1987
Conference Location
Lake Tahoe, CA, USA

Citation

Schafft, H. , Lechner, J. , Sabi, B. and Smith, R. (1988), How Good Are Your Estimates of t<sub>50</sub> and &#916;, Proc., 1987 Wafer Reliability Workshop, Lake Tahoe, CA, USA (Accessed June 16, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 30, 1988, Updated October 12, 2021