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A Highly Flexible, Minimum Dead Time, Data Intensive Acquisition System for Characterizing Low Level Decay Events Constructed with Commericial Off-the-Shelf Hardware

Published

Author(s)

Alan H. Band, George A. Klouda, Stephen H. Pheiffer
Citation
Journal of Radioanalytical and Nuclear Chemistry

Citation

Band, A. , Klouda, G. and Pheiffer, S. (2007), A Highly Flexible, Minimum Dead Time, Data Intensive Acquisition System for Characterizing Low Level Decay Events Constructed with Commericial Off-the-Shelf Hardware, Journal of Radioanalytical and Nuclear Chemistry (Accessed October 11, 2025)

Issues

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Created January 1, 2007, Updated February 19, 2017
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