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Highly Charged Ion Studies at the NIST EBIT, ed. by J.D. Gillaspy

Published

Author(s)

L P. Ratliff, J R. Roberts
Citation
Trapping Highly Charged Ions Fundamentals and Applications
Publisher Info
Nova Science Publishers ,

Citation

Ratliff, L. and Roberts, J. (2001), Highly Charged Ion Studies at the NIST EBIT, ed. by J.D. Gillaspy, Nova Science Publishers , (Accessed November 7, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2001, Updated February 17, 2017