Newbury, D.
(2018),
'High Resolution' Is Often Sought in SEM Imaging, But Establishing Visibility May Be the Challenge: Always Ask "What Might I Be Missing?", Microscopy and Microanalysis, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925016
(Accessed November 26, 2025)
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'High Resolution' Is Often Sought in SEM Imaging, But Establishing Visibility May Be the Challenge: Always Ask "What Might I Be Missing?"
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Abstract
The visibility of objects in scanning electron microscope (SEM) images is limited by random noise in the signal, and a relation can be established between the contrast produced by an object relative to local background and the instrument parameters: electron detector efficiency; beam current, and pixel dwell time.Citation
Microscopy and Microanalysis
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Journals
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Keywords
contrast, scanning electron microscope, threshold equation, visibility
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Created August 1, 2018, Updated September 29, 2025