Bell, M.
and McKeown, D.
(1990),
High-Precision Optical Reflectometer for the Study of Semiconductor Materials and Structures, Review of Scientific Instruments
(Accessed August 4, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
High-Precision Optical Reflectometer for the Study of Semiconductor Materials and Structures
Published
Author(s)
M I. Bell, D. A. McKeown
Citation
Review of Scientific Instruments
Volume
61
Issue
10
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created September 30, 1990, Updated October 12, 2021