Bell, M.
and McKeown, D.
(1990),
High-Precision Optical Reflectometer for the Study of Semiconductor Materials and Structures, Review of Scientific Instruments
(Accessed April 20, 2025)
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High-Precision Optical Reflectometer for the Study of Semiconductor Materials and Structures
Published
Author(s)
M I. Bell, D. A. McKeown
Citation
Review of Scientific Instruments
Volume
61
Issue
10
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 30, 1990, Updated October 12, 2021