Armstrong, J.
, Newbury, D.
and Carpenter, P.
(1997),
High Precision Multiple keV X-Ray Analysis: Tests of Ionization Cross Sections and Monte Carlo Algorithms?, Microscopy and Microanalysis
(Accessed May 11, 2025)
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High Precision Multiple keV X-Ray Analysis: Tests of Ionization Cross Sections and Monte Carlo Algorithms?
Published
Author(s)
, , P Carpenter
Citation
Microscopy and Microanalysis
Volume
3
Pub Type
Journals
Citation
Issues
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Created December 1, 1997, Updated February 17, 2017