Jeanneret, B.
, Rufenacht, A.
and Burroughs, C.
(2001),
High Precision Comparison Between SNS and SIS Josephson Voltage Standards, IEEE Transactions on Instrumentation and Measurement
(Accessed July 17, 2025)
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High Precision Comparison Between SNS and SIS Josephson Voltage Standards
Published
Author(s)
Blaise Jeanneret, Alain Rufenacht,
Abstract
Recently, a new Josephson voltage standard based on a 1 V programmable chip provided by the National Institute of Standards and Technology (NIST) was implemented at the Swiss Federal Office of Metrology (OFMET). A comparison with a conventional Josephson voltage standard showed an agreement of (1.4 1 3.4) X 10-10 at 1 V. This result demonstrates the new system is functioning properly and can be used in various types of measurements. In particular, it will be one of the key components of the Watt balance experiment (1) that is presently under construction at OFMET.Citation
IEEE Transactions on Instrumentation and Measurement
Volume
50
Issue
2
Pub Type
Journals
Keywords
electrical measurements, Josephson arrays, voltage standard, Zener diodes
Citation
Issues
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Created April 14, 2001, Updated October 12, 2021