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Heteroscedastic Gaussian Process Regression for ReRAM Device Modeling

Published

Author(s)

Imtiaz Hossen, Yi Zang, Mark Anders, Lin Wang, Gina Adam
Proceedings Title
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Proceedings
Conference Dates
March 6-9, 2022
Conference Location
Oika, JP

Citation

Hossen, I. , Zang, Y. , Anders, M. , Wang, L. and Adam, G. (2022), Heteroscedastic Gaussian Process Regression for ReRAM Device Modeling, 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Proceedings , Oika, JP, [online], https://doi.org/10.1109/EDTM53872.2022.9798256, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=933576 (Accessed November 29, 2022)
Created June 21, 2022, Updated July 7, 2022