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Gradient Chemical Micropatterns: A Reference Substrate for Surface Nanometrology

Published

Author(s)

D Julthongpiput, Michael J. Fasolka, Wenhua Zhang, Tinh Nguyen, Eric J. Amis

Abstract

We present fabrication routes for a new type of surface specimen that exhibits a micropattern with a gradient in chemical contrast between the pattern domains. Design elements in the specimen allow chemical contrast in the micropattern to be related to well-established surface characterization, like contact angle measurements. These gradient specimens represent a reference tool for calibrating image contrast in chemically-sensitive scanned probe microscopy techniques, and a platform for the high-throughput analysis of polymer thin film behavior.
Citation
Nano Letters
Volume
5(8)

Keywords

chemical pattern, high-throughput analysis of thin film, SPM, surface energy gradient

Citation

Julthongpiput, D. , Fasolka, M. , Zhang, W. , Nguyen, T. and Amis, E. (2005), Gradient Chemical Micropatterns: A Reference Substrate for Surface Nanometrology, Nano Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852493 (Accessed February 21, 2024)
Created August 1, 2005, Updated February 19, 2017