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Gradient Chemical Micropatterns: A Reference Substrate for Surface Nanometrology
Published
Author(s)
D Julthongpiput, Michael J. Fasolka, Wenhua Zhang, Tinh Nguyen, Eric J. Amis
Abstract
We present fabrication routes for a new type of surface specimen that exhibits a micropattern with a gradient in chemical contrast between the pattern domains. Design elements in the specimen allow chemical contrast in the micropattern to be related to well-established surface characterization, like contact angle measurements. These gradient specimens represent a reference tool for calibrating image contrast in chemically-sensitive scanned probe microscopy techniques, and a platform for the high-throughput analysis of polymer thin film behavior.
Julthongpiput, D.
, Fasolka, M.
, Zhang, W.
, Nguyen, T.
and Amis, E.
(2005),
Gradient Chemical Micropatterns: A Reference Substrate for Surface Nanometrology, Nano Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852493
(Accessed October 7, 2025)