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A Global View of Chemical Metrology: Recent Developments and Basic Concepts

Published

Author(s)

Hratch G. Semerjian
Proceedings Title
Proceedings of the 1st Interamerican Workshop on Metrology in Chemistry
Conference Dates
January 1, 0001
Conference Location
Rio de Janeiro,
Conference Title
1st Interamerican Workshop on Metrology in Chemistry

Citation

Semerjian, H. (1997), A Global View of Chemical Metrology: Recent Developments and Basic Concepts, Proceedings of the 1st Interamerican Workshop on Metrology in Chemistry, Rio de Janeiro, (Accessed April 16, 2024)
Created December 16, 1997, Updated February 19, 2017