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Fractional diffusion, low exponent levy stable laws, and slow motion denoising of helium ion microscope nanoscale imagery:

Published

Author(s)

Alfred S Carasso, Andras E Vladar
Citation
- NIST IR 7727
Report Number
NIST IR 7727

Citation

Carasso, A. and Vladar, A. (2010), Fractional diffusion, low exponent levy stable laws, and slow motion denoising of helium ion microscope nanoscale imagery:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7727 (Accessed April 13, 2024)
Created January 1, 2010, Updated May 20, 2023