Carasso, A.
and Vladar, A.
(2010),
Fractional diffusion, low exponent levy stable laws, and slow motion denoising of helium ion microscope nanoscale imagery:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7727 (Accessed April 30, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Fractional diffusion, low exponent levy stable laws, and slow motion denoising of helium ion microscope nanoscale imagery:
Published
Author(s)
,
Citation
- NIST IR 7727
Report Number
NIST IR 7727
Pub Type
NIST Pubs
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created January 1, 2010, Updated May 20, 2023