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Formalism for the determination of intermediate stress gradients using X-ray diffraction

Published

Author(s)

Thomas Gnaupel-Herold

Abstract

A method is outlined that allows the determination of one-dimensional stress gradients at length scales greater than 0.2 mm. By using standard four-circle X-ray diffractometer equipment and simple aperture components, length resolutions down to 0.05 mm in one direction can be achieved through constant orientation of a narrow, line-shaped beam spot. Angle calculations are given for the adjustment of goniometer angles, and for the effective azimuth and tilt of the scattering vector for general angle settings in a four-circle goniometer. The latter is necessary for the computation of stresses from lattice strain measurements.
Citation
Journal of Applied Crystallography
Volume
42
Issue
2

Keywords

Xray diffraction, high spatial resolution, stress gradient, angle calculation

Citation

Gnaupel-Herold, T. (2009), Formalism for the determination of intermediate stress gradients using X-ray diffraction, Journal of Applied Crystallography, [online], https://doi.org/10.1107/s0021889809004300, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=610026 (Accessed April 17, 2024)
Created March 5, 2009, Updated March 21, 2024