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Final Report: BILATERAL COMPARISON OF DC VOLTAGE REFERENCES BETWEEN CENAM AND NIST (SIM.EM.BIPM-K11.b.)

Published

Author(s)

Dionisio Hernandez, Enrique Navarette, David Aviles, Yi-hua D. Tang

Abstract

A comparison of Josephson Voltage Standards (JVS) between the National Institute of Standards and Technology (NIST) and the Centro Nacional de Metrolog?a (CENAM) held at CENAM from 21st to 23rd of March 2006 is reported. The comparison was made at the 10 V level by measuring four Zener references using the JVS of CENAM and the transportable Compact Josephson Voltage Standard (CJVS) of NIST. The difference between the measurements was -34.7 nV with an uncertainty of 43.2 nV at 95 % level of confidence.
Citation
BIPM KCBD

Citation

Hernandez, D. , Navarette, E. , Aviles, D. and Tang, Y. (2008), Final Report: BILATERAL COMPARISON OF DC VOLTAGE REFERENCES BETWEEN CENAM AND NIST (SIM.EM.BIPM-K11.b.), BIPM KCBD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32801 (Accessed May 23, 2024)

Issues

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Created May 31, 2008, Updated October 12, 2021