Bohn, J.
, Nesbitt, D.
and Gallagher, A.
(2001),
Field Enhancement in Apertureless Near-Field Scanning Optical Microscopy, Journal of the Optical Society of America A-Optics Image Science and Vision
(Accessed May 11, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Field Enhancement in Apertureless Near-Field Scanning Optical Microscopy
Published
Author(s)
, , Alan Gallagher
Abstract
The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of > 15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orders of magnitude. This enhancement arises both from the antenna effect of the elongated probe and from a proximity effect when the probe is near the substrate surface and its image dipoles play a role.Citation
Journal of the Optical Society of America A-Optics Image Science and Vision
Volume
18
Issue
No. 12
Pub Type
Journals
Keywords
intensity enhancement, NSOM, resolution
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 1, 2001, Updated February 17, 2017