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Field Enhancement in Apertureless Near-Field Scanning Optical Microscopy

Published

Author(s)

J L. Bohn, David J. Nesbitt, Alan Gallagher

Abstract

The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of > 15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orders of magnitude. This enhancement arises both from the antenna effect of the elongated probe and from a proximity effect when the probe is near the substrate surface and its image dipoles play a role.
Citation
Journal of the Optical Society of America A-Optics Image Science and Vision
Volume
18
Issue
No. 12

Keywords

intensity enhancement, NSOM, resolution

Citation

Bohn, J. , Nesbitt, D. and Gallagher, A. (2001), Field Enhancement in Apertureless Near-Field Scanning Optical Microscopy, Journal of the Optical Society of America A-Optics Image Science and Vision (Accessed July 16, 2024)

Issues

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Created December 1, 2001, Updated February 17, 2017