Bohn, J.
, Nesbitt, D.
and Gallagher, A.
(2001),
Field Enhancement in Apertureless Near-Field Scanning Optical Microscopy, Journal of the Optical Society of America A-Optics Image Science and Vision
(Accessed April 26, 2024)
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Field Enhancement in Apertureless Near-Field Scanning Optical Microscopy
Published
Author(s)
, , Alan Gallagher
Abstract
The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of > 15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orders of magnitude. This enhancement arises both from the antenna effect of the elongated probe and from a proximity effect when the probe is near the substrate surface and its image dipoles play a role.Citation
Journal of the Optical Society of America A-Optics Image Science and Vision
Volume
18
Issue
No. 12
Pub Type
Journals
Keywords
intensity enhancement, NSOM, resolution
Citation
Created December 1, 2001, Updated February 17, 2017