Field Enhancement in Apertureless Near-Field Scanning Optical Microscopy
J L. Bohn, David J. Nesbitt, Alan Gallagher
The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of > 15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orders of magnitude. This enhancement arises both from the antenna effect of the elongated probe and from a proximity effect when the probe is near the substrate surface and its image dipoles play a role.
Journal of the Optical Society of America A-Optics Image Science and Vision
intensity enhancement, NSOM, resolution
, Nesbitt, D.
and Gallagher, A.
Field Enhancement in Apertureless Near-Field Scanning Optical Microscopy, Journal of the Optical Society of America A-Optics Image Science and Vision
(Accessed March 2, 2024)