Ferromagnetic Resonance Detection with a Torsion-mode Atomic-force Microscope

Published

February 1, 2000

Author(s)

M. Loehndorf, John M. Moreland, Pavel Kabos

Abstract

We have developed a ferromagnetic resonance (FMR) instrument based on a torsion-mode atomic-force microscope (AFM). The instrument measures the torque on a magnetized thin film in a static out-of-plane field perpendicular to the film surface. The magnetic film is deposited outo an AFM microcantilever. FMR measurements are performed at a fixed microwave frequency of 9.15 GHz with a sweeping in-plane field. At the FMR condition, the change in the average in-plane magnetization of the film is at a maximum corresponding to a maximum change in the torque on the AFM cantilever. Our instrument is capable of measuring fluctuations of in-plane magnetization of 63.3 A/m of NiFe film samples with a total volume of 1.1x10^-10 cm³. Given a signal-to-noise ratio of 40, we estimate a magnetic moment sensitivity of 1.7 x 10^-16 A/m².

Citation

Applied Physics Letters

Volume

76

Issue

9

Pub Type

Journals

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Keywords

atomic force microscope, ferromagnetic resonance (FMR), instrument measures the torque, magnetization fluctuations microcantilev

Citation

Loehndorf, M. , Moreland, J. and Kabos, P. (2000), Ferromagnetic Resonance Detection with a Torsion-mode Atomic-force Microscope, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=6022 (Accessed October 14, 2025)