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On The Feasibility of Performing Line Scale Measurements on a High Accuracy Coordinate Measuring Machine

Published

Author(s)

Wei Ren, Roy E. Sundahl, Theodore D. Doiron

Abstract

This paper describes recent work in transitioning line scale measurements from an old LSI machine to a vision probe equipped Moore-M48 Coordinate Measuring Machine (CMM) based platform.
Conference Dates
July 24-28, 2016
Conference Location
Saint Paul, MN
Conference Title
2016 NCSLI Workshop & Symposium

Keywords

Line Scale Interferometer, CMM, Laser system, Camera, Microscope

Citation

Ren, W. , Sundahl, R. and Doiron, T. (2016), On The Feasibility of Performing Line Scale Measurements on a High Accuracy Coordinate Measuring Machine, 2016 NCSLI Workshop & Symposium, Saint Paul, MN (Accessed July 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 26, 2016, Updated February 19, 2017