Bray, S.
, Ekin, J.
and Nilles, M.
(1998),
Fatigue-Induced Electrical Degradation of Composite High-Purity/High-Strength Aluminum Rings at 4 K, Advances in Cryogenic Engineering
(Accessed May 10, 2025)
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Fatigue-Induced Electrical Degradation of Composite High-Purity/High-Strength Aluminum Rings at 4 K
Published
Author(s)
S L. Bray, , M J. Nilles
Citation
Advances in Cryogenic Engineering
Issue
44
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1997, Updated October 12, 2021