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Fabrication and Characterization of In-Situ Grown Epitaxial Ba1-xSrxTi03) Composition Spreads

Published

Author(s)

K S. Chang, M A. Aronova, O Famodu, Jason Hattrick-Simpers, S E. Lofland, Ichiro Takeuchi, C J. Lu, Leonid A. Bendersky, H C. Chang

Abstract

We have used our combinatorial pulsed laser deposition system to in-situ fabricate epitaxial Ba(sub1-x)Sr(sub x)Ti)(sub 3) thin film composition spreads on (100) LaAl0(sub3) substrates. Multimode quantitative microwave microscopy was used to perform dielectric chacterization of the spreads at multiple microwave frequencies simultaneously. Systematic variation in dielectric properties as a function of composition is studied. The multi-mode measurements allow frequency dispersion studies. We observe strong composition-dependent dielectric dispersion in Ba(sub 1-x)Sr(sub x)Ti0(sub3).
Proceedings Title
Combinatorial and Artificial Intelligence Methods in Materials Science, Symposium S | | | Materials Research Society
Volume
700
Conference Dates
November 1, 2001
Conference Location
Undefined
Conference Title
Materials Research Society Symposium Proceedings

Keywords

Ba-Sr-Ti-0, characterization, combinatorial methods, dielectrics

Citation

Chang, K. , Aronova, M. , Famodu, O. , Hattrick-Simpers, J. , Lofland, S. , Takeuchi, I. , Lu, C. , Bendersky, L. and Chang, H. (2002), Fabrication and Characterization of In-Situ Grown Epitaxial Ba<sub>1-x</sub>Sr<sub>x</sub>Ti0<sub>3</sub>) Composition Spreads, Combinatorial and Artificial Intelligence Methods in Materials Science, Symposium S | | | Materials Research Society, Undefined (Accessed April 19, 2024)
Created June 30, 2002, Updated October 12, 2021