Extreme Ultraviolet Spectra of Highly Charged Xenon Observed with an Electron Beam Ion Trap
Dmitry D. Osin, Joseph Reader, John D. Gillaspy, Yuri Ralchenko
Extreme ultraviolet spectra of highly charged xenon atoms were produced with an electron beam ion trap (EBIT) at the National Institute of Standards and Technology and recorded with a flat-field grazing-incidence spectrometer. The spectra were measured in the wavelength range of 4.5 nm to19.5 nm as the beam energy was varied between 1.5 keV and 5.9 keV. Different ionization stages were enhanced at the various beam energies. Wavelength calibration was provided by spectra of highly-charged neon, argon, and iron, as well as previously measured lines of highly charged xenon. Identifications of strong n=3-n=3 transitions from Ni-like xenon (26+) to Na-like xenon (43+) were determined with the aid of collisional-radiative modeling of the EBIT plasma, which provided good quantitative agreement between simulated and measured spectra. About 50 lines were identified, 30 of which are new. Seven of these lines represent magnetic-dipole transitions within the 3s23pn ground configurations, and one is an electric-quadrupole transition within the 3s23p2 ground configuration of the Si-like ion. A list of adopted wavelengths used as calibration standards is given in an appendix.
Journal of Physics B-Atomic Molecular and Optical Physics
atomic spectroscopy, highly charged ions, fusion diagnostics, xenon, Xe, electron beam ion trap, EBIT
, Reader, J.
, Gillaspy, J.
and Ralchenko, Y.
Extreme Ultraviolet Spectra of Highly Charged Xenon Observed with an Electron Beam Ion Trap, Journal of Physics B-Atomic Molecular and Optical Physics
(Accessed December 4, 2023)