Extended Feature Set Profile Specification

Published

January 14, 2013

Author(s)

Melissa Taylor, Will Chapman, Austin Hicklin, George Kiebuzinski, John Mayer-Splain, Rachel Wallner, Peter Komarinski

Abstract

This specification defines Extended Feature Set (EFS) Profiles - sets of features to be used in latent friction ridge (fingerprint, palmprint or plantar) searches of automated friction ridge identification systems (AFIS). The EFS Profiles are designed to be interoperable among AFIS systems from different vendors and to enable cross-jurisdictional searches that would not otherwise be practical. Multiple EFS Profiles are defined to allow for tradeoffs between examiner time and search accuracy. EFS Profiles also may be used simply to document latent friction ridge features, such as for potential use in legal proceedings or exchange between latent examiners, and need not be for AFIS matching purposes.

Citation

Special Publication (NIST SP) - 1134

Report Number

1134

NIST Pub Series

Special Publication (NIST SP)

Pub Type

NIST Pubs

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DOI Link

Keywords

AFIS, fingerprint, forensic science, interoperability, latent print, palmprint, forensics

Standards, Public safety, Materials, Information technology, Forensic Science and Digital evidence

Citation

Taylor, M. , Chapman, W. , Hicklin, A. , Kiebuzinski, G. , Mayer-Splain, J. , Wallner, R. and Komarinski, P. (2013), Extended Feature Set Profile Specification, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.1134 (Accessed May 24, 2022)