Bouldin, C.
(1989),
EXAFS Study of a Buried Germanium Layer in Silicon, Physica (North-Holland, Amsterdam)
(Accessed September 25, 2023)
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EXAFS Study of a Buried Germanium Layer in Silicon
Published
Author(s)
Citation
Physica (North-Holland, Amsterdam)
Volume
B
Issue
158
Pub Type
Journals
Citation
Created December 31, 1989, Updated February 17, 2017