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Evidence for Structural Change and a Deep Electron Trap in Separation by Implanted Oxygen Oxides

Published

Author(s)

J. F. Conley, Patrick M. Lenahan, Peter Roitman
Citation
IEEE Transactions on Nuclear Science
Volume
NS-39
Issue
6

Citation

Conley, J. , Lenahan, P. and Roitman, P. (1992), Evidence for Structural Change and a Deep Electron Trap in Separation by Implanted Oxygen Oxides, IEEE Transactions on Nuclear Science (Accessed April 24, 2024)
Created November 30, 1992, Updated October 12, 2021