Conley, J.
, Lenahan, P.
and Roitman, P.
(1992),
Evidence for Structural Change and a Deep Electron Trap in Separation by Implanted Oxygen Oxides, IEEE Transactions on Nuclear Science
(Accessed March 27, 2025)
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Evidence for Structural Change and a Deep Electron Trap in Separation by Implanted Oxygen Oxides
Published
Author(s)
J. F. Conley, Patrick M. Lenahan,
Citation
IEEE Transactions on Nuclear Science
Volume
NS-39
Issue
6
Pub Type
Journals
Citation
Issues
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Created November 30, 1992, Updated October 12, 2021