Evaluating CT for Metrology: The Influence of Material Thickness on Measurements

Published

October 7, 2014

Author(s)

Joseph Schlecht, Eric Ferley, Shaun COUGHLIN , Steven D. Phillips, Vincent Lee, Craig M. Shakarji

Abstract

X-ray imaging provides a non-destructive means to measure internal features of a workpiece, and CT offers unique capabilities for internal measurements in 3-D. However, due to the computational nature of CT and its indirect measurement process, assessing its efficacy for dimensional metrology is essential. CT reconstruction artefacts are of primary concern as they may influence measurements. In this paper we investigate the effect of varying material thickness on CT reconstructions for metrology. We show that applying several thicknesses of material does not present significant issues for CT-based metrology. The results advocate further exploration of CT as a means for internal workpiece measurement and metrology.

Conference Dates

October 6-10, 2014

Conference Location

Prague, AL, CZ

Conference Title

11th European Conference on Non-Destructive Testing

Pub Type

Conferences

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Keywords

Computed tomography (CT), metrology, CT reconstruction artefacts, material thickness

Citation

Schlecht, J. , Ferley, E. , COUGHLIN, S. , Phillips, S. , Lee, V. and Shakarji, C. (2014), Evaluating CT for Metrology: The Influence of Material Thickness on Measurements, 11th European Conference on Non-Destructive Testing, Prague, AL, CZ, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=916961 (Accessed October 22, 2025)