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End-to-End Quality Information Framework (QIF) Technology Survey

Published

Author(s)

John L. Michaloski, Thomas D. Hedberg, Hui-Min Huang, Thomas R. Kramer

Abstract

The goal of this paper is to understand how quality information characterizing the manufactured parts can be reported in a XML standardized format. The Quality Information Framework (QIF) is an ANSI standard sponsored by the Dimensional Metrology Standards Consortium (DMSC) that defines an integrated set of XML information models to enable the effective exchange of metrology data throughout the entire manufacturing quality measurement process - from product design to inspection planning to execution to analysis and reporting. The desire is that QIF will help foster a pervasive "digital thread" throughout the product lifecycle contributing to feedforward and feedback flow of quality information. The hope is that widespread adoption of QIF will lead to better and more optimized part design and manufacturing processes performance.
Citation
NIST Interagency/Internal Report (NISTIR) - 8127
Report Number
8127

Keywords

quality, QIF, PMI, CAD, manufacturing, metrology

Citation

Michaloski, J. , Hedberg, T. , Huang, H. and Kramer, T. (2016), End-to-End Quality Information Framework (QIF) Technology Survey, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.8127 (Accessed October 17, 2021)
Created May 9, 2016, Updated November 10, 2018