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Electromagnetic Properties of Materials: The NIST Metrology Program

Published

Author(s)

Claude Weil
Proceedings Title
Proc., 5th DOD Electromagnetic Windows Symp.
Conference Dates
October 19-21, 1993
Conference Location
Boulder, CO

Citation

Weil, C. (1993), Electromagnetic Properties of Materials: The NIST Metrology Program, Proc., 5th DOD Electromagnetic Windows Symp., Boulder, CO (Accessed July 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 1, 1993, Updated February 19, 2017