Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Electromagnetic Properties of Materials: The NIST Metrology Program

Published

Author(s)

Claude Weil
Proceedings Title
Proc., 5th DOD Electromagnetic Windows Symp.
Conference Dates
October 19-21, 1993
Conference Location
Boulder, CO

Citation

Weil, C. (1993), Electromagnetic Properties of Materials: The NIST Metrology Program, Proc., 5th DOD Electromagnetic Windows Symp., Boulder, CO (Accessed October 17, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created October 1, 1993, Updated February 19, 2017
Was this page helpful?