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Electro-Optic Imaging Millimeter-Wave Propagation On-Wafer

Published

Author(s)

Bryan Bosworth, Nick Jungwirth, Jerome Cheron, Franklyn Quinlan, Nate Orloff, Chris Long, Ari Feldman

Abstract

We demonstrate an electro-optic imaging system for mmWaves propagating along a coplanar waveguide. Using dual optical frequency combs and a polarization resolved microscope, we image signals with bandwidth >100 GHz and >48 dB dynamic range.
Proceedings Title
2023 Conference on Lasers and Electro-Optics (CLEO)
Conference Dates
May 7-12, 2023
Conference Location
San Jose, CA, US

Keywords

Electro-optic frequency comb, electro-optic sampling, polarization microscopy, millimeter-wave

Citation

Bosworth, B. , Jungwirth, N. , Cheron, J. , Quinlan, F. , Orloff, N. , Long, C. and Feldman, A. (2023), Electro-Optic Imaging Millimeter-Wave Propagation On-Wafer, 2023 Conference on Lasers and Electro-Optics (CLEO), San Jose, CA, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935972 (Accessed July 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 27, 2023, Updated December 22, 2023