Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Effect of strain-induced anisotropy on magnetization dynamics in Y3Fe5O12 films recrystallized on a lattice-mismatched substrate

Published

Author(s)

Adam Krysztofik, Sevgi Ozoglu, Robert D. McMichael, Luis Emerson Coy Romero

Abstract

We report on the correlation of structural and magnetic properties of Y3Fe5O12 (YIG) films deposited on Y3Al5O12 (YAG) substrates using pulsed laser deposition (PLD). The recrystallization process leads to an unexpected formation of interfacial tensile strain and consequently strain-induced anisotropy contributing to the perpendicular magnetic anisotropy. The ferromagnetic resonance linewidth of YIG is significantly increased in comparison to a film on a lattice-matched Gd3Ga5O12 (GGG) substrate. Notably, the linewidth dependency on frequency has a negative slope. The linewidth behavior is explained with the proposed anisotropy dispersion model.
Citation
Scientific Reports
Volume
11
Issue
1

Keywords

YIG, magnetism, thin films, ferromagnetic resonance

Citation

Krysztofik, A. , Ozoglu, S. , McMichael, R. and Coy Romero, L. (2021), Effect of strain-induced anisotropy on magnetization dynamics in Y3Fe5O12 films recrystallized on a lattice-mismatched substrate, Scientific Reports, [online], https://doi.org/10.1038/s41598-021-93308-3, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932109 (Accessed March 29, 2024)
Created July 7, 2021, Updated November 29, 2022