Published: May 11, 2005
Michael L. Schneider, Anthony B. Kos, Thomas J. Silva
In this study, angle-resolved pulsed inductive microwave magnetometry is used to investigate the symmetry of the dynamic anisotropy of thin Permalloy films. We measured the dynamic anisotropy field as a function of angle between the easy axis and the applied bias field. We found that, in addition to the expected uniaxial anisotropy, there is a rotatable component of anisotropy. This component of the anisotropy is present only during the dynamics measurements and is attributed to surface effects in the thin films. However, the native oxide layer is not the cause of the rotatable anisotropy components in these films.
Citation: Applied Physics Letters
Pub Type: Journals
Anisotropy, magnetodynamics, Permalloy
Created May 11, 2005, Updated February 19, 2017