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Direct Separation of Short Range Order in Intermixed Nanocrystalline and Amorphous Phases

Published

Author(s)

Charles E. Bouldin, A I. Frenkel, A V. Kolobov, I K. Robinson, J O. Cross, Y Maeda

Abstract

Diffraction Anomalous Fine Structure (DAFS) and Extended X-Ray Absorption Fine Structure (EXAFS) measurements have been combined to determine short-range order (SRO) about a single atomic type in a sample of mixed amorphous and nanocrystalline phases. EXAFS yields information about the SRO of all Ge atoms in the sample, while DAFS determines the SRO of only the ordered fraction. We determine that the first-shell distance distribution is bimodal; the nanocrystalline distance is the same as the bulk crystal, to within 0.01(2) A, but the amorphous Ge-Ge bond length is expanded by 0.076(19) A. This approach can be applied to many systems of mixed amorphous and nanocrystalline phases.
Citation
Physical Review Letters
Volume
89
Issue
No. 28

Keywords

amorphous, crystallization, nanocrystalline, x-ray scattering

Citation

Bouldin, C. , Frenkel, A. , Kolobov, A. , Robinson, I. , Cross, J. and Maeda, Y. (2002), Direct Separation of Short Range Order in Intermixed Nanocrystalline and Amorphous Phases, Physical Review Letters (Accessed July 23, 2024)

Issues

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Created December 1, 2002, Updated February 19, 2017