Bouldin, C.
, Frenkel, A.
, Kolobov, A.
, Robinson, I.
, Cross, J.
and Maeda, Y.
(2002),
Direct Separation of Short Range Order in Intermixed Nanocrystalline and Amorphous Phases, Physical Review Letters
(Accessed April 25, 2024)
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Direct Separation of Short Range Order in Intermixed Nanocrystalline and Amorphous Phases
Published
Author(s)
, A I. Frenkel, A V. Kolobov, I K. Robinson, J O. Cross, Y Maeda
Abstract
Diffraction Anomalous Fine Structure (DAFS) and Extended X-Ray Absorption Fine Structure (EXAFS) measurements have been combined to determine short-range order (SRO) about a single atomic type in a sample of mixed amorphous and nanocrystalline phases. EXAFS yields information about the SRO of all Ge atoms in the sample, while DAFS determines the SRO of only the ordered fraction. We determine that the first-shell distance distribution is bimodal; the nanocrystalline distance is the same as the bulk crystal, to within 0.01(2) A, but the amorphous Ge-Ge bond length is expanded by 0.076(19) A. This approach can be applied to many systems of mixed amorphous and nanocrystalline phases.Citation
Physical Review Letters
Volume
89
Issue
No. 28
Pub Type
Journals
Keywords
amorphous, crystallization, nanocrystalline, x-ray scattering
Citation
Created December 1, 2002, Updated February 19, 2017