Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Direct Digital Simultaneous Phase-Amplitude Noise and Allan Deviation Measurement System

Published

Author(s)

Marco Pomponio, Archita Hati, Craig Nelson

Abstract

In this paper, we present a direct digital measurement system capable of simultaneously measuring phase noise, amplitude noise, and Allan deviation with and without cross-correlation. The residual phase noise of the single-channel system achieves L(1 Hz) = −143 dBc/Hz for a 10 MHz input signal, and an Allan deviation noise floor of 3.2 × 10−15 at 1 second averaging time (τ ). The systems' performance improves as expected with cross-correlation, resulting in an average limited residual white noise floor of −185 dBc/Hz after only a few minutes of averaging, an improvement of 30 dB compared to a single-channel system. It also reaches an average limited flicker phase noise floor of L(1 Hz) = −160 dBc/Hz within a span of less than two days, with an Allan deviation of 5 × 10−16 @ τ = 1 second. To the best of our knowledge, this represents the lowest noise performance ever reported for a digital measurement system. Our solution is based on a pair of high-performance analog-to-digital converters and a single system-on-a-chip (SoC) with multiple processors and a field programmable gate array (FPGA). The architecture allows for processing all data samples in real-time without dead-time between calculation frames, enabling the fastest averaging possible during cross-correlation.
Citation
IEEE Ultrasonics, Ferroelectrics, and Frequency Control Society Letters
Volume
4

Keywords

Allan Deviation, Amplitude Noise, Analog-to-Digital Converter (ADC), Cross Correlation, Digital Down Conversion, Direct Digital Measurement, Field Programmable Gate Array (FPGA), Phase Noise.

Citation

Pomponio, M. , Hati, A. and Nelson, C. (2024), Direct Digital Simultaneous Phase-Amplitude Noise and Allan Deviation Measurement System, IEEE Ultrasonics, Ferroelectrics, and Frequency Control Society Letters, [online], https://doi.org/10.1109/OJUFFC.2024.3487147, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957735 (Accessed October 7, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created October 28, 2024, Updated December 5, 2024
Was this page helpful?