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Digitizer Linearity Measurement with a Josephson Arbitrary Waveform Synthesizer

Published

Author(s)

Jesus Mejia, Alain Rufenacht, Raegan Johnson, Anna Fox, Nathan Flowers-Jacobs, Samuel Benz, Paul Dresselhaus

Abstract

This article examines the non-linearity and gain error of a commercial digitizer on the 100 mV range with a Josephson Arbitrary Waveform Synthesizer (JAWS) as a reference. Different digitizer input filter settings were studied, and the shortest aperture of the digitization window was chosen to maximize the processing speed. The results revealed a maximum non-linearity of 0.09 µV on the 100 mV range, over a 10 mV (rms) spread, at a filter frequency of 1 kHz. A gain stability over 12 hours was determined to be 0.92 µV/V.
Proceedings Title
Conference on Precision Electromagnetic Measurements (CPEM)
Conference Dates
July 6-12, 2024
Conference Location
Denver, CO, US
Conference Title
NCSL International & CPEM Workshop and Symposium

Keywords

Digital-analog conversion, leakage currents, measurement uncertainty, Josephson junction arrays, standards, superconducting integrated circuits, voltage measurement.

Citation

Mejia, J. , Rufenacht, A. , Johnson, R. , Fox, A. , Flowers-Jacobs, N. , Benz, S. and Dresselhaus, P. (2024), Digitizer Linearity Measurement with a Josephson Arbitrary Waveform Synthesizer, Conference on Precision Electromagnetic Measurements (CPEM), Denver, CO, US, [online], https://doi.org/10.1109/CPEM61406.2024.10646120, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957468 (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 30, 2024, Updated October 31, 2024