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PUBLICATIONS

A Developmental Expert System for Test Structure Data Evaluation

Published

Author(s)

Loren W. Linholm, D. Khera, C. P. Reeve, Michael W. Cresswell
Proceedings Title
Proc., IEEE International Conference on Microelectronic Test Structures
Conference Dates
February 22-23, 1988
Conference Location
Long Beach, CA, USA
Pub Type
Conferences

Citation

Linholm, L. , Khera, D. , Reeve, C. and Cresswell, M. (1988), A Developmental Expert System for Test Structure Data Evaluation, Proc., IEEE International Conference on Microelectronic Test Structures, Long Beach, CA, USA (Accessed October 18, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1988, Updated October 12, 2021
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