Carver, G.
(1981),
Development of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device (CCD) imagers ::annual report, May 15, 1980 to May 14, 1981, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.81-2319
(Accessed December 4, 2024)
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Development of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device (CCD) imagers ::annual report, May 15, 1980 to May 14, 1981
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- NBS IR 81-2319
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NBS IR 81-2319
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NIST Pubs
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Created January 1, 1981, Updated May 19, 2023