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Development of High Conductive Cantilevers for Atomic Force Microscopy Point Contact Measurements

Published

Author(s)

R. E. Thomson, John M. Moreland
Citation
Journal of Vacuum Science and Technology B
Volume
13 (3)

Citation

Thomson, R. and Moreland, J. (1995), Development of High Conductive Cantilevers for Atomic Force Microscopy Point Contact Measurements, Journal of Vacuum Science and Technology B (Accessed April 14, 2024)
Created May 31, 1995, Updated October 12, 2021