Thomson, R.
and Moreland, J.
(1995),
Development of High Conductive Cantilevers for Atomic Force Microscopy Point Contact Measurements, Journal of Vacuum Science and Technology B
(Accessed December 11, 2024)
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Development of High Conductive Cantilevers for Atomic Force Microscopy Point Contact Measurements
Published
Author(s)
R. E. Thomson,
Citation
Journal of Vacuum Science and Technology B
Volume
13 (3)
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 1995, Updated October 12, 2021