Thurber, W.
(1971),
Determination of deep impurities in Silicon and Germanium by infrared photoconductivity:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.570
(Accessed September 15, 2024)
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Determination of deep impurities in Silicon and Germanium by infrared photoconductivity:
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- NBS TN 570
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NBS TN 570
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NIST Pubs
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Created January 1, 1971, Updated May 19, 2023