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Details of the Measurement of Rare Earth and Other Trace Element Abundances by Secondary Ion Mass Spectrometry

Published

Author(s)

Albert J. Fahey
Citation
International Journal of Mass Spectrometry
Volume
176

Citation

Fahey, A. (1998), Details of the Measurement of Rare Earth and Other Trace Element Abundances by Secondary Ion Mass Spectrometry, International Journal of Mass Spectrometry (Accessed May 29, 2024)

Issues

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Created February 12, 1998, Updated February 19, 2017