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Decoherence in Josephson Qubits from Dielectric Loss
Published
Author(s)
John M. Martinis, Ken B. Cooper, Robert Mcdermott, Matthias Steffen, Markus Ansmann, Kevin Osborn, Katarina Cicak, Seongshik Oh, David P. Pappas, Raymond Simmonds, Clare Yu
Abstract
Dielectric loss from two-level states is shown to be a dominant decoherence source in superconducting quantum bits. Depending on the qubit design, dielectric loss from insulating materials or the tunnel junction can lead to short coherence times. We show that a variety of microwave and qubit measurements are well modeled by loss from resonant absorption of two-level defects. Our results demonstrate that this loss can be significantly reduced by using better dielectrics and fabricating junctions of small area < 10 'm^2. With a redesigned phase qubit employing low-loss dielectrics, the energy relaxation rate has been improved by a factor of 20, opening up the possibility of multi-qubit gates and algorithms.
Martinis, J.
, Cooper, K.
, Mcdermott, R.
, Steffen, M.
, Ansmann, M.
, Osborn, K.
, Cicak, K.
, Oh, S.
, Pappas, D.
, Simmonds, R.
and Yu, C.
(2005),
Decoherence in Josephson Qubits from Dielectric Loss, Science, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32029
(Accessed October 13, 2025)