Dark Field X-ray Microscopy Below Liquid-Helium Temperature: The Case of NaMnO2

Published

October 1, 2023

Author(s)

Jayden Plumb, Ishwor Poudyal, Rebecca Dally, Samantha Daly, Stephen Wilson, Zahir Islam

Abstract

Dark field X-ray microscopy (DFXM) is an experimental technique employed to investigate material properties by probing their 'mesoscale,' or microscale structures, in a bulk-sensitive manner using hard X-rays at synchrotron radiation sources. However, challenges remain when it comes to applications of this technique to examine low-temperature phenomena in quantum materials, which exhibit complex phase transitions at cryogenic temperatures. One such material is NaMnO2, which hosts an antiferromagnetic transition at 45 K that is suspected to coincide with local structural transitions from its majority monoclinic phase to nanoscale triclinic domains. Direct observation of local heterogeneities and this effect at low temperatures in NaMnO2 is an important step in understanding this material and serves as an ideal candidate study for expanding the DFXM experimental design space. This paper details a foundational high-resolution DFXM study, down to liquid‑helium temperature and below, conducted to explore phase transitions in NaMnO2. The outlined experiment ushers in the evaluation of other functional materials at low temperatures using this technique.

Citation

Materials Characterization

Volume

204

Pub Type

Journals

Download Paper

https://doi.org/10.1016/j.matchar.2023.113174

Local Download

Keywords

Dark-Field X-ray Micrsocopy, Full-Field Microscopy, Diffraction Contrast Microscopy, Low Temperature, NaMnO2, Structural Transition

Citation

Plumb, J. , Poudyal, I. , Dally, R. , Daly, S. , Wilson, S. and Islam, Z. (2023), Dark Field X-ray Microscopy Below Liquid-Helium Temperature: The Case of NaMnO2, Materials Characterization, [online], https://doi.org/10.1016/j.matchar.2023.113174, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935908 (Accessed December 11, 2024)