Elmquist, R.
(1998),
Cryogenic Current Comparator Measurements at 77 K Using Thallium-2223 Thick-film Shields, Tech. Dig., Conf. on Precision Electromagnetic Measurements, Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15733
(Accessed May 11, 2025)
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Cryogenic Current Comparator Measurements at 77 K Using Thallium-2223 Thick-film Shields
Published
Author(s)
Abstract
This paper describes resistance ratio measurements using cryogenic current comparator (CCC) devices that operate at 77 K. The magnetic shields are Thallium-based thick films on MgO substrates. The effectiveness of three shield geometries is determined using one-to-one and ten-to-one winding ratios.Proceedings Title
Tech. Dig., Conf. on Precision Electromagnetic Measurements
Conference Dates
July 6-10, 1998
Conference Location
Washington, DC
Pub Type
Conferences
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Keywords
cryogenic current comparator, magnetic shield, resistance ratio
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 1, 1998, Updated February 19, 2017